Substrate-induced high-frequency noise in deep sub-micron MOSFETs for RF applications.
S. V. KishoreGlenn ChangGeorgios AsmanisChris HullFrederic StubbePublished in: CICC (1999)
Keyphrases
- high frequency
- low frequency
- high frequencies
- frequency band
- wavelet transform
- high resolution
- high frequency components
- visual quality
- subband
- low pass
- discrete wavelet transform
- frequency domain
- wavelet coefficients
- wavelet decomposition
- noise model
- high pass
- phase shifting
- wavelet domain
- rf sputtering
- high quality
- blocking artifacts
- noise level
- multi resolution analysis
- subband decomposition
- low bit rate coding