Role of Conductive-Metal-Oxide to HfOx, Interfacial Layer on the Switching Properties of Bilayer TaOx/HfOx ReRAM.

Tommaso Stecconi Youri Popoff Roberto Guido Donato Francesco Falcone Mattia Halter Marilyne Sousa Folkert Horst Antonio La Porta Bert J. Offrein Valeria Bragaglia

Published in: ESSDERC (2022)

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