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A new approach to the modeling of oxide breakdown on CMOS circuits.

Raul FernándezRosana RodríguezMontserrat NafríaXavier Aymerich
Published in: Microelectron. Reliab. (2004)
Keyphrases
  • analog vlsi
  • high speed
  • circuit design
  • delay insensitive
  • power consumption
  • vlsi circuits
  • case study
  • low cost
  • low power
  • data sets
  • power dissipation