A highly reliable NBTI Resilient 6T SRAM cell.

Jawar Singh N. Vijaykrishnan

Published in: Microelectron. Reliab. (2013)

Keyphrases

highly reliable
power consumption
data transmission
random access memory
microscopic images
multiscale
low power
web services composition
high throughput
cell division
neural network
microscope images
three dimensional
image segmentation
knowledge base
machine learning
data mining