Towards runtime testing in automotive embedded systems.
Christian BradatschTheo UngererRafael ZalmanAndre LajtkepPublished in: SIES (2011)
Keyphrases
- embedded systems
- embedded software
- safety critical
- low cost
- resource limited
- embedded devices
- computing power
- processing power
- hardware software
- software systems
- real time systems
- real time image processing
- embedded real time systems
- consumer electronics
- hw sw
- field programmable gate array
- protocol stack
- flash memory
- high level
- test suite
- open source