Deep Ensembling with No Overhead for either Training or Testing: The All-Round Blessings of Dynamic Sparsity.
Shiwei LiuTianlong ChenZahra AtashgahiXiaohan ChenGhada SokarElena MocanuMykola PechenizkiyZhangyang WangDecebal Constantin MocanuPublished in: ICLR (2022)