Login / Signup
On the Tolerance to Manufacturing Defects in Molecular QCA Tiles for Processing-by-wire.
Jing Huang
Mariam Momenzadeh
Fabrizio Lombardi
Published in:
J. Electron. Test. (2007)
Keyphrases
</>
cellular automata
real time
data processing
information processing
neural network
data mining
decision making
quality control
database
data sets
three dimensional
input image
high speed
manufacturing systems
hardware and software
printed circuit boards