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A new switch-level test pattern generation algorithm based on single path over a graph representation.

Carles FerrerJoan OliverElena Valderrama
Published in: EURO-DAC (1990)
Keyphrases
  • graph representation
  • generation algorithm
  • test data generation
  • pattern matching
  • high speed
  • graph model
  • knowledge base
  • shortest path
  • test cases
  • graph representations