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Two methods of selecting Gaussian kernel parameters for one-class SVM and their application to fault detection.
Yingchao Xiao
Huangang Wang
Lin Zhang
Wenli Xu
Published in:
Knowl. Based Syst. (2014)
Keyphrases
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fault detection
neural network
semi supervised
kernel parameters
industrial processes
genetic algorithm
artificial neural networks
multi class
kernel function
cross validation