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Two methods of selecting Gaussian kernel parameters for one-class SVM and their application to fault detection.

Yingchao XiaoHuangang WangLin ZhangWenli Xu
Published in: Knowl. Based Syst. (2014)
Keyphrases
  • fault detection
  • neural network
  • semi supervised
  • kernel parameters
  • industrial processes
  • genetic algorithm
  • artificial neural networks
  • multi class
  • kernel function
  • cross validation