A CMOS imager using focal-plane pinhole effect for confocal multibeam scanning microscopy.
Min-Woong SeoAn WangZhuo LiKeita YasutomiKeiichiro KagawaShoji KawahitoPublished in: Sensors, Cameras, and Systems for Industrial and Scientific Applications (2012)
Keyphrases
- focal plane
- imaging systems
- infrared
- analog vlsi
- high speed
- confocal images
- machine vision
- image formation
- image sensor
- high resolution
- three dimensional
- synthetic aperture
- image analysis
- image processing
- structured light
- stereo images
- high throughput
- microscopy images
- multi channel
- light field
- camera calibration
- microscope images
- image retrieval