Cost reduction of system-level tests with stressed structural tests and SVM.

Jing-Jia Liou Meng-Ta Hsieh Jun-Fei Cherng Harry H. Chen

Published in: VLSI-SoC (2015)

Keyphrases

cost reduction
feature selection
multi class
support vector
knn
data mining
reinforcement learning
training set
feature vectors
non stationary