The Control Model for a Knowledge-Based Approach to VLSI Compaction Design.
S. F. Steven ChenPei-Yung HsiaoWu-Shiung FengShun-Nan DaiWen-Zyh WangPublished in: IFIP Congress (1989)
Keyphrases
- conceptual framework
- conceptual model
- prior knowledge
- domain knowledge
- computational model
- theoretical framework
- high level
- expert knowledge
- experimental data
- control structure
- metamodel
- probabilistic model
- em algorithm
- mathematical model
- design process
- statistical model
- real time
- high speed
- knowledge representation
- objective function
- case study
- neural network