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lines at 532 nm.

Jun YeLennart RobertssonSusanne PicardLong Sheng MaJohn L. Hall
Published in: IEEE Trans. Instrum. Meas. (1999)
Keyphrases
  • hough transform
  • line segments
  • straight line
  • neural network
  • machine learning
  • hidden markov models
  • data sets
  • real world
  • viewpoint
  • probabilistic model
  • line drawings
  • line detection