A Layout Sensitivity Model for Estimating Electromigration-vulnerable Narrow Interconnects.

Rani S. Ghaida Payman Zarkesh-Ha

Published in: J. Electron. Test. (2009)

Keyphrases

probabilistic model
database
objective function
prior knowledge
statistical model
sensitivity analysis
formal model
search engine
bayesian networks
reinforcement learning
high speed
input data
theoretical analysis
post processing
simulation model