Guest Editors' Introduction: System IC Design Challenges beyond 32 nm.
William H. Joyner Jr.David C. YehPublished in: IEEE Des. Test Comput. (2008)
Keyphrases
- design principles
- engineering design
- design process
- lessons learned
- data mining
- design issues
- genetic algorithm
- artificial intelligence
- multimedia
- user interface
- interactive systems
- database
- optimal design
- design methodology
- integrated circuit
- computer aided
- relational databases
- case study
- knowledge base
- machine learning
- real world
- data sets