Design of non-contact 2Gb/s I/O test methods for high bandwidth memory (HBM).
Hyunui LeeSukyong KangHye-Seung YuWon-Joo YunJae-Hun JungSungoh AhnWang-Soo KimBeomyong KilYoo-Chang SungSang-Hoon ShinYong-Sik ParkYong-Hwan KimKyung-Woo NamIndal SongKyomin SohnYong-Cheol BaeJung-Hwan ChoiSeong-Jin JangGyo-Young JinPublished in: A-SSCC (2016)
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