A self-test on wafer level for a MEM gyroscope readout based on ΔΣ modulation.

Sebastian Nessler Maximilian Marx Yiannos Manoli

Published in: ISCAS (2017)

Keyphrases

levels of abstraction
test cases
higher level
information retrieval
genetic algorithm
end to end
neural network
control system
low level
computer simulation
wireless communication