Review of Neuro-Space Mapping Method for Transistor Modeling.
Shuxia YanXu DongXiaoyi JinWeiguang ShiWei XuPublished in: EEET (2018)
Keyphrases
- modeling method
- similarity measure
- experimental evaluation
- detection method
- support vector machine svm
- parameter space
- optimization method
- segmentation method
- significant improvement
- high accuracy
- computational cost
- synthetic data
- cost function
- multiresolution
- artificial neural networks
- computational complexity
- objective function
- decision trees
- classification accuracy
- edge detection
- high speed
- clustering method
- feature space
- bayesian networks
- face recognition