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Intelligent Automatic Test Pattern Generation for Digital Circuits Based on Reinforcement Learning.
Wenxing Li
Hongqin Lyu
Shengwen Liang
Tiancheng Wang
Pengyu Tian
Huawei Li
Published in:
ATS (2023)
Keyphrases
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digital circuits
reinforcement learning
databases
data flow
semi automatic
evolvable hardware
learning algorithm
model free
intelligent systems
fully automatic
function approximation
data model
pattern matching
integrity constraints
reinforcement learning algorithms
learning capabilities