A Systematic Method for Arranging Diagnostic Tests in Linear Analog DC and AC Circuits.
Michal TadeusiewiczStanislaw HalgasPublished in: J. Electron. Test. (2017)
Keyphrases
- circuit design
- high accuracy
- clustering method
- significant improvement
- detection method
- experimental evaluation
- preprocessing
- closed form
- model selection
- diagnostic tests
- probabilistic model
- computational cost
- support vector
- least squares
- detection algorithm
- pairwise
- computational complexity
- synthetic data
- mathematical model
- convergence rate
- objective function
- multiscale