An IC manufacturing yield model considering intra-die variations.

Jianfeng Luo Subarna Sinha Qing Su Jamil Kawa Charles C. Chiang

Published in: DAC (2006)

Keyphrases

high level
computational model
similarity measure
objective function
probabilistic model
management system
sensitivity analysis
artificial intelligence
image sequences
video sequences
mathematical model
neural network model
formal model
network model