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Embedded test control schemes for compression in SOCs.

Douglas KaySung ChungSamiha Mourad
Published in: DAC (2002)
Keyphrases
  • image compression
  • compression ratio
  • databases
  • test data
  • data mining
  • data structure
  • data compression
  • learning algorithm
  • digital images
  • low cost
  • embedded systems
  • compression scheme
  • embedded image