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Atomistic Modelling and Simulation of Transmission Electron Microscopy Images: Application to Intrinsic Defects of Graphene.

Cyril GuedjLéonard JailletFrançois RousseStéphane Redon
Published in: SIMULTECH (2018)
Keyphrases
  • microscopy images
  • geometric structure
  • electron microscope
  • image analysis
  • automated analysis
  • electron microscopy