A 55nm Ultra Low Leakage Deeply Depleted Channel technology optimized for energy minimization in subthreshold SRAM and logic.
Harsh N. PatelAbhishek RoyFarah B. YahyaNingxi LiuBenton H. CalhounKazuyuki KumenoMakoto YasudaAkihiko HaradaTaiji EmaPublished in: ESSCIRC (2016)
Keyphrases
- energy minimization
- energy function
- graph cuts
- leakage current
- low voltage
- embedded dram
- markov random field
- random access memory
- cmos technology
- problems in computer vision
- max flow min cut
- global minimum
- curve evolution
- belief propagation
- interactive segmentation
- max flow
- low level vision
- dual decomposition
- min cut max flow
- field effect transistors
- image segmentation
- global minimization
- metal oxide semiconductor
- image dependent
- low power
- nm technology
- push relabel
- power consumption
- linear programming
- simulated annealing
- high speed