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Predicting reconstruction quality within compressive sensing for atomic force microscopy.
Patrick Steffen Pedersen
Jan Østergaard
Torben Larsen
Published in:
GlobalSIP (2015)
Keyphrases
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compressive sensing
reconstruction quality
atomic force microscopy
transform domain
sparse representation
reconstructed image
spatial resolution
reconstruction error
random projections
signal processing
image representation
spatial domain
image compression
image reconstruction
preprocessing
image classification