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A methodology for systematic built-in self-test of phase-locked loops targeting at parametric failures.

Guo YuPeng Li
Published in: ITC (2007)
Keyphrases
  • phase locked
  • built in self test
  • real time
  • genetic algorithm
  • data structure
  • databases
  • neural network
  • machine learning
  • face recognition
  • information technology
  • multiresolution
  • root cause
  • failure detection