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Low frequency noise characterization in 0.13 mum p-MOSFETs. Impact of scaled-down 0.25, 0.18 and 0.13 mum technologies on 1/f noise.
M. Marin
Y. Akue Allogo
M. de Murcia
P. Llinares
J. C. Vildeuil
Published in:
Microelectron. Reliab. (2004)
Keyphrases
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low frequency
high frequency
frequency domain
wavelet transform
wavelet analysis
wavelet coefficients
random noise
signal to noise ratio
noise reduction
high frequency components
multiscale
subband
wavelet domain
noise level
contourlet transform