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Low-overhead design of soft-error-tolerant scan flip-flops with enhanced-scan capability.

Ashish GoelSwarup BhuniaHamid Mahmoodi-MeimandKaushik Roy
Published in: ASP-DAC (2006)
Keyphrases
  • error tolerant
  • low overhead
  • design process
  • real time
  • data mining
  • pattern recognition
  • wireless sensor networks
  • high reliability