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Experimental Investigation of Charge Sharing Induced SET Depending on Transistors in Abutted Rows in 65 nm Bulk CMOS Technology.
Xiaowei He
Daheng Yue
Pengcheng Huang
Zhenyu Zhao
Published in:
IEEE Access (2022)
Keyphrases
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cmos technology
low power
power consumption
spl times
parallel processing
image processing
optical flow
edge detection
high speed
digital signal processing
low voltage