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An Open Modular Test Concept for the DSP KISS-16Vs.

J. PreißnerG.-H. Huaman-BolloG. MahlichJohannes SchuckHans SahmP. WeingartD. WeinsziehrJ. YeandelR. Evans
Published in: ITC (1992)
Keyphrases
  • signal processing
  • test data
  • databases
  • multiscale
  • concept learning
  • statistical significance
  • data sets
  • information retrieval
  • metadata
  • case study
  • search algorithm