A SVM Surrogate Model-Based Method for Parametric Yield Optimization.
Angelo CiccazzoGianni Di PilloVittorio LatorrePublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2016)
Keyphrases
- support vector machine svm
- classification method
- cost function
- optimization process
- support vector
- significant improvement
- detection method
- support vector machine
- computational cost
- high accuracy
- hybrid method
- constrained optimization
- dynamic programming
- preprocessing
- similarity measure
- training data
- training process
- parametric models
- decision trees