Login / Signup

Switched-Capacitor Track-and-Hold Amplifiers With Low Sensitivity to Op-Amp Imperfections.

Hirokazu YoshizawaGabor C. Temes
Published in: IEEE Trans. Circuits Syst. I Regul. Pap. (2007)
Keyphrases
  • metal oxide
  • high sensitivity
  • x ray
  • artificial intelligence
  • database
  • data sets
  • feature extraction
  • sensitivity analysis
  • high levels
  • power supply