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An Expert Solution to Functional Testability Analysis of VLSI Circuits.
Massimo Bombana
Giacomo Buonanno
Patrizia Cavalloro
Fabrizio Ferrandi
Donatella Sciuto
Giuseppe Zaza
Published in:
SEKE (1993)
Keyphrases
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vlsi circuits
computer vision
optimal solution
data analysis
real time
image analysis
complex systems
functional analysis