Login / Signup
Study on Chip Reliability Modeling Based on Mutually Dependent Competing Failure of Solder Joints in Different Failure Modes.
Longteng Li
Bo Jing
Jiaxing Hu
Xiaoxuan Jiao
Jinxin Pan
Hongda Sun
Published in:
IEEE Access (2020)
Keyphrases
</>
failure modes
mutually dependent
experimental study
social networks
theoretical framework
data sets
neural network
machine learning
genetic algorithm
learning algorithm
video sequences
information technology
low cost
factors affecting