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Delay testing of PD-SOI circuits.

Morteza DamavandpeymaRasoul YousefiBehjat Forouzandeh
Published in: IEICE Electron. Express (2008)
Keyphrases
  • power dissipation
  • test cases
  • critical path
  • search engine
  • high speed
  • test set
  • data sets
  • motion estimation
  • response time
  • asynchronous circuits