C
search
search
reviewers
reviewers
feeds
feeds
assignments
assignments
settings
logout
A closed-form trapped-charge-included drain current compact model for amorphous oxide semiconductor thin-film transistors.
Fei Yu
Chuanzhong Xu
Gongyi Huang
Wei Lin
Tsair-Chun Liang
Published in:
Microelectron. Reliab. (2018)
Keyphrases
</>
closed form
thin film
probabilistic model
closed form expressions
cost function
parameter estimation
power consumption
high density
closed form solutions
iterative procedure