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A closed-form trapped-charge-included drain current compact model for amorphous oxide semiconductor thin-film transistors.

Fei YuChuanzhong XuGongyi HuangWei LinTsair-Chun Liang
Published in: Microelectron. Reliab. (2018)
Keyphrases
  • closed form
  • thin film
  • probabilistic model
  • closed form expressions
  • cost function
  • parameter estimation
  • power consumption
  • high density
  • closed form solutions
  • iterative procedure