Digital Forensic Atomic Force Microscopy of Semiconductor Memory Arrays.

Struan Gray Stefan Axelsson

Published in: IFIP Int. Conf. Digital Forensics (2019)

Keyphrases

digital forensics
atomic force microscopy
forensic analysis
memory requirements
computer forensics
law enforcement
memory usage
memory space
associative memory
main memory
limited memory
memory management
memory size
semiconductor manufacturing
computing power
random access
information management