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High-speed inline defect detection for TFT-LCD array process using a novel support vector data description.

Yi-Hung LiuYan-Chen LiuYen-Zen Chen
Published in: Expert Syst. Appl. (2011)
Keyphrases
  • high speed
  • defect detection
  • support vector data description
  • data mining
  • machine learning
  • pattern recognition
  • multi objective