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Reliability enhancement using in-field monitoring and recovery for RF circuits.

Doohwang ChangSule OzevBertan BakkalogluSayfe KiaeiEngin AfacanGünhan Dündar
Published in: VTS (2014)
Keyphrases
  • monitoring system
  • real time
  • image processing
  • failure detection
  • databases
  • relevance feedback
  • reliability analysis
  • software aging
  • database
  • artificial intelligence
  • high speed
  • image enhancement
  • vlsi circuits