Pseudorandom testing for mixed-signal circuits.
Chen-Yang PanKwang-Ting ChengPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1997)
Keyphrases
- mixed signal
- pseudorandom
- vlsi circuits
- low power
- multi channel
- uniformly distributed
- digital circuits
- cmos technology
- power consumption
- random number
- high speed
- secret key
- low cost
- analog to digital converter
- power dissipation
- signal processing
- stream cipher
- digital signal processing
- encryption algorithm
- parallel processing
- low voltage