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Model Order Reduction for nanoelectronics coupled problems with many inputs.
Nicodemus Banagaaya
Lihong Feng
Wim Schoenmaker
Peter Meuris
Aarnout Wieers
Renaud Gillon
Peter Benner
Published in:
DATE (2016)
Keyphrases
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statistical model
computational model
mathematical model
probability distribution
management system
formal model
integer linear programming
data sets
image segmentation
lower bound
prior knowledge
theoretical framework
experimental data
decision problems
object model