Negative and Positive Muon-Induced SEU Cross Sections in 28-nm and 65-nm Planar Bulk CMOS SRAMs.
Wang LiaoMasanori HashimotoSeiya ManabeYukinobu WatanabeShin-ichiro AbeKeita NakanoHayato TakeshitaMotonobu TampoSoshi TakeshitaYasuhiro MiyakePublished in: IRPS (2019)