Embedding metric learning into an extreme learning machine for scene recognition.
Chen WangGuohua PengBernard De BaetsPublished in: Expert Syst. Appl. (2022)
Keyphrases
- metric learning
- scene recognition
- distance metric
- object recognition
- pairwise
- semi supervised
- image representation
- learning tasks
- dimensionality reduction
- feature space
- distance function
- object detection
- multi task
- semi supervised learning
- support vector regression
- labeled data
- background knowledge
- learning algorithm
- supervised learning
- support vector