A Deep Learning-Based Approach for Defect Detection and Removing on Archival Photos.
Roman A. SizyakinViacheslav V. VoroninN. GaponAlexander A. ZelenskyAleksandra PizuricaPublished in: Image Processing: Algorithms and Systems (2020)
Keyphrases
- deep learning
- defect detection
- unsupervised learning
- unsupervised feature learning
- mental models
- machine learning
- weakly supervised
- feature extraction
- restricted boltzmann machine
- image representation
- object class
- learning strategies
- visual features
- higher order
- co occurrence
- pattern recognition
- decision trees
- feature selection