A Tool for Printed Circuit Board Defect Detection based on the YOLO Algorithm.

Miao Hou Zhiming Lan Qiuhong Hong Xiangyuan Zhu Hong Nie

Published in: ICNC-FSKD (2023)

Keyphrases

learning algorithm
computational complexity
dynamic programming
optimal solution
k means
detection algorithm
defect detection
machine learning
np hard
objective function
information technology
knowledge management
dynamic systems