Some thoughts about scanning probe microscopy, micromechanics, and storage.
Dieter W. PohlPublished in: IBM J. Res. Dev. (1995)
Keyphrases
- storage requirements
- image analysis
- high throughput
- data storage
- scan data
- storage and retrieval
- random access
- mass storage
- data sets
- remote server
- processing capabilities
- storage space
- file system
- computer vision
- genetic algorithm
- image enhancement
- storage devices
- single image
- electron microscopy
- solid state
- efficient storage
- relational databases