Models and methods checking mantissas by inequalities for on-line testing of digital circuits in critical applications.
Alexander V. DrozdM. Al-dhabiSvetlana AntoshchukA. MartinyukMiroslav DrozdPublished in: EWDTS (2017)
Keyphrases
- digital circuits
- statistical models
- learned models
- significant improvement
- probabilistic model
- learning algorithm
- predictive power
- mathematical models
- machine learning methods
- machine learning algorithms
- sufficient conditions
- computational cost
- preprocessing
- neural network
- benchmark datasets
- complex systems
- low power
- decision trees