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Design of a Temperature-Aware Low-Voltage SRAM With Self-Adjustable Sensing Margin Enhancement for High-Temperature Applications up to 300 °C.
Tony Tae-Hyoung Kim
Ngoc Le Ba
Published in:
IEEE J. Solid State Circuits (2014)
Keyphrases
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high temperature
low voltage
design considerations
design process
cmos technology
image processing
response time
power consumption
design methodology