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Design of a Temperature-Aware Low-Voltage SRAM With Self-Adjustable Sensing Margin Enhancement for High-Temperature Applications up to 300 °C.

Tony Tae-Hyoung KimNgoc Le Ba
Published in: IEEE J. Solid State Circuits (2014)
Keyphrases
  • high temperature
  • low voltage
  • design considerations
  • design process
  • cmos technology
  • image processing
  • response time
  • power consumption
  • design methodology