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Automatic target defect identification for TFT-LCD array process inspection using kernel FCM-based fuzzy SVDD ensemble.

Yi-Hung LiuSzu-Hsien LinYi-Ling HsuehMing-Jiu Lee
Published in: Expert Syst. Appl. (2009)
Keyphrases
  • fuzzy clustering
  • neural network
  • fuzzy logic
  • defect detection
  • clustering algorithm
  • video sequences
  • support vector
  • multiresolution
  • membership functions
  • fuzzy c means
  • ensemble learning