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Automatic target defect identification for TFT-LCD array process inspection using kernel FCM-based fuzzy SVDD ensemble.
Yi-Hung Liu
Szu-Hsien Lin
Yi-Ling Hsueh
Ming-Jiu Lee
Published in:
Expert Syst. Appl. (2009)
Keyphrases
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fuzzy clustering
neural network
fuzzy logic
defect detection
clustering algorithm
video sequences
support vector
multiresolution
membership functions
fuzzy c means
ensemble learning