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Thermal-aware Test Data Compression for System-on-Chip Based on Modified Bitmask Based Methods.
Azhaganantham Arulmurugan
Govindasamy Murugesan
Balasubramaniam Vivek
Published in:
J. Electron. Test. (2020)
Keyphrases
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test data
training data
test set
computer vision
image processing
search algorithm
training set
power consumption
multiple sources